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Your selections:
Design, characterization and control of serial-kinematic X-Y-Z nanopositioner for high-speed Atomic Force Microscopy
- Wadikhaye, Sachin
Improving the scan rate and image quality in tapping mode Atomic Force Microscopy with piezoelectric shunt control
- Fairbairn, Matthew W., Moheimani, S. O. Reza, Fleming, Andrew J.
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